E. Zielińska-Rohozińska: search on Z-Library

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1

X-ray diffraction investigations of annealing characteristics in P+-implanted silicon crystals

E. Zielińska-Rohozińska

Journal:

physica status solidi (a)

Year:

1977

Language:

english

File:

PDF, 393 KB

english, 1977

2

Local order of Te impurity atoms and free electron concentration in heavily doped GaAs:Te

T Slupinski, E Zielinska-Rohozinska

Journal:

Thin Solid Films

Year:

2000

Language:

english

File:

PDF, 368 KB

english, 2000

3

Observations of the “Pendellösung” Fringes with the Three-Crystal X-Ray Spectrometer

K. Godwood, M. Lefeld-Sosnowska, E. Zielińska-Rohozińska

Journal:

physica status solidi (b)

Year:

1964

Language:

english

File:

PDF, 251 KB

english, 1964

4

X-ray diffraction investigations of defects generated in Si single crystals by thermal oxidation

M. Lefeld-Sosnowska, E. Zielińska-Rohozińska, J. Gronkowski

Journal:

physica status solidi (a)

Year:

1975

Language:

english

File:

PDF, 1.94 MB

english, 1975

5

X-ray characterization of defect structure in LEC GaAs crystals

G. Kowalski, E. Zielinska-Rohozinska, T. Czekalski

Journal:

Journal of Crystal Growth

Year:

1991

Language:

english

File:

PDF, 881 KB

english, 1991

6

Observations of the Effects of X-Ray Polarization on Pendellösung Fringes with the Three-Crystal X-Ray Spectrometer

E. Zielińska-rohozińska

Journal:

physica status solidi (b)

Year:

1968

Language:

english

File:

PDF, 148 KB

english, 1968

7

Digitization and image processing methods for enhancement and quantification of grazing-incidence X-ray topographs

Jørgen Rheinländer, Salim Abdali, Elzbieta Zielinska-Rohozinska

Journal:

Journal of X-Ray Science and Technology

Year:

1994

Language:

english

File:

PDF, 6.49 MB

english, 1994

8

X-ray topographic study of defects in annealed silicon

J. Gronkowski, M. Lefeld-sosnowska, E. Zielinska-rohozinska

Year:

1993

Language:

english

File:

PDF, 382 KB

english, 1993

9

X-ray Characterization of Defect Structure in LEC Annealed GaAs Crystals

T. Czekalski, Dr. hab. E. Zielińska-Rohozińska

Journal:

Crystal Research and Technology

Year:

1992

Language:

english

File:

PDF, 420 KB

english, 1992

10

X-ray plane wave topography of annealed silicon crystals using asymmetric reflections

S. Abdali, L. Nielsen, E. Zielinska-Rohozinska, L. Gerward

Journal:

physica status solidi (a)

Year:

1993

Language:

english

File:

PDF, 675 KB

english, 1993

11

High resolution X-ray diffraction study of the Si doping influence on columnar crystal growth of GaN layers

V.S. Harutyunyan, E. Zielińska-Rohozińska, M. Regulska

Journal:

Journal of Alloys and Compounds

Year:

2004

Language:

english

File:

PDF, 165 KB

english, 2004

12

Investigation of X-ray diffraction contrast asymmetries of the implanted region–nonimplanted region boundary

E. Zielińska-Rohozińska, M. Lefeld-Sosnowska, J. Gronkowski, J. Krylow

Journal:

physica status solidi (a)

Year:

1973

Language:

english

File:

PDF, 455 KB

english, 1973

13

X-ray diffuse-scattering study of defects in α-sapphire

Jerzy Gronkowski, Janusz Borowski, Elżbieta Zielińska-Rohozińska, Małgorzata Kowalska, Krzysztof Pakuła

Journal:

physica status solidi (a)

Year:

2006

Language:

english

File:

PDF, 477 KB

english, 2006

14

X-ray topographic investigation of cellular structure in semi-insulating GaAs

E. Zielińska-Rohozińska

Journal:

Journal of Crystal Growth

Year:

1988

Language:

english

File:

PDF, 287 KB

english, 1988

15

High resolution X-ray diffraction defect structure characterization in Si-doped and undoped GaN films

E. Zielińska-Rohozińska, M. Regulska, V.S. Harutyunyan, K. Pakuła, J. Borowski

Journal:

Materials Science and Engineering: B

Year:

2002

Language:

english

File:

PDF, 167 KB

english, 2002

16

X-ray section topography in the Bragg case

E. Zielińska-Rohozińska

Journal:

physica status solidi (a)

Year:

1980

Language:

english

File:

PDF, 908 KB

english, 1980

17

The bragg spherical wave diffraction contrast of screw dislocations in si single crystals

E. Zielińska-Rohozińska

Journal:

physica status solidi (a)

Year:

1980

Language:

english

File:

PDF, 304 KB

english, 1980

18

Characterization of microdefects in GaAs crystals with high-resolution X-ray diffractometry

E. Zielińska-Rohozińska, T. Słupiński, J. Gronkowski, T. Harasimowicz, J. Borowski

Journal:

Il Nuovo Cimento D

Year:

1997

Language:

english

File:

PDF, 2.01 MB

english, 1997

19

High-resolution characterization of microdefects by X-ray diffuse scattering

Gronkowski, J., Borowski, J., Zielinska-Rohozinska, E.

Journal:

Philosophical Transactions Mathematical Physical & Engineering Sciences

Year:

1999

Language:

english

File:

PDF, 215 KB

english, 1999

20

Local Order of Te Impurity Atoms in Heavily Doped GaAs:Te and Accompanying Electron Localization Effect

Slupinski, T., Zielinska-Rohozinska, E.

Journal:

MRS Proceedings

Year:

1999

Language:

english

File:

PDF, 2.25 MB

english, 1999

21

X-ray diffuse scattering characterization of microdefects in highly Te-doped annealed GaAs crystals

J. Borowski, J. Gronkowski, E. Zielinska-rohozinska, T. Slupinski

Year:

1998

Language:

english

File:

PDF, 156 KB

english, 1998

22

Schwenkfilm-Methode und ihre Anwendung bei Untersuchungen dynamischer Effekte der Röntgenstrahlstreuung im Kristallgitter

J. Auleytner, E. Zielińska-Rohozińska

Journal:

physica status solidi (b)

Year:

1963

Language:

german

File:

PDF, 324 KB

german, 1963

23

X-Ray Topography and Crystal Characterization || High-Resolution Characterization of Microdefects by X-Ray Diffuse Scattering

Jerzy Gronkowski, Janusz Borowski and Elżbieta Zielińska-Rohozińska

Journal:

Philosophical Transactions Mathematical Physical & Engineering Sciences

Year:

1999

Language:

english

File:

PDF, 896 KB

english, 1999

24

Triple axis diffractometric investigations of the microstructure of thin AlxGa1-xN epitaxial films

E. Zielinska-Rohozinska, M. Kowalska, K. Pakuła

Journal:

Crystal Research and Technology

Year:

2003

Language:

english

File:

PDF, 159 KB

english, 2003

25

Measurement of the Anomalous Absorption Coefficients in the Bragg Case by a Three-Crystal X-Ray Spectrometer

E. Zielińska-Rohozińska

Journal:

physica status solidi (b)

Year:

1965

Language:

english

File:

PDF, 431 KB

english, 1965

26

Symmetrical and asymmetrical X-ray section topographs of ion-implanted silicon

M. Lefeld-Sosnowska, E. Zielińska-Rohozińska

Journal:

physica status solidi (a)

Year:

1976

Language:

english

File:

PDF, 119 KB

english, 1976

27

Strain relaxation in Ga1−xInxN thin layers grown on GaN sublayers

E. Zielińska-Rohozińska, J. Gronkowski, K. Pakuła, M. Majer, M. Regulska, L. Nowicki

Journal:

Journal of Alloys and Compounds

Year:

2001

Language:

english

File:

PDF, 454 KB

english, 2001

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